Optimal testing of multilevel logic circuits

Bibliographic Details
Main Author:	Bystrov, Alexandre
Published:	Edinburgh Napier University 1999
Subjects:	621.3192 Circuits
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.300327

id	ndltd-bl.uk-oai-ethos.bl.uk-300327
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-3003272015-03-19T06:53:50ZOptimal testing of multilevel logic circuitsBystrov, Alexandre1999621.3192CircuitsEdinburgh Napier Universityhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.300327Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.3192 Circuits
spellingShingle	621.3192 Circuits Bystrov, Alexandre Optimal testing of multilevel logic circuits
author	Bystrov, Alexandre
author_facet	Bystrov, Alexandre
author_sort	Bystrov, Alexandre
title	Optimal testing of multilevel logic circuits
title_short	Optimal testing of multilevel logic circuits
title_full	Optimal testing of multilevel logic circuits
title_fullStr	Optimal testing of multilevel logic circuits
title_full_unstemmed	Optimal testing of multilevel logic circuits
title_sort	optimal testing of multilevel logic circuits
publisher	Edinburgh Napier University
publishDate	1999
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.300327
work_keys_str_mv	AT bystrovalexandre optimaltestingofmultilevellogiccircuits
_version_	1716752967233699840

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