A test strategy planning methodology driven by economic parameters

Bibliographic Details
Main Author:	Dear, Ian D.
Published:	Brunel University 1990
Subjects:	621.37 Integrated circuit testing
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292562

id	ndltd-bl.uk-oai-ethos.bl.uk-292562
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-2925622015-03-19T10:27:17ZA test strategy planning methodology driven by economic parametersDear, Ian D.1990621.37Integrated circuit testingBrunel Universityhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292562Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.37 Integrated circuit testing
spellingShingle	621.37 Integrated circuit testing Dear, Ian D. A test strategy planning methodology driven by economic parameters
author	Dear, Ian D.
author_facet	Dear, Ian D.
author_sort	Dear, Ian D.
title	A test strategy planning methodology driven by economic parameters
title_short	A test strategy planning methodology driven by economic parameters
title_full	A test strategy planning methodology driven by economic parameters
title_fullStr	A test strategy planning methodology driven by economic parameters
title_full_unstemmed	A test strategy planning methodology driven by economic parameters
title_sort	test strategy planning methodology driven by economic parameters
publisher	Brunel University
publishDate	1990
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292562
work_keys_str_mv	AT deariand ateststrategyplanningmethodologydrivenbyeconomicparameters AT deariand teststrategyplanningmethodologydrivenbyeconomicparameters
_version_	1716774434364194816

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