Electron microscopy and luminescence study of defects in semiconductor silicon

Electron microscopy and luminescence study of defects in semiconductor silicon

Bibliographic Details
Main Author:	Johnson, Fiona Jane
Published:	University of Bristol 1990
Subjects:	530.41 Solid-state physics
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.279773

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