Electron microscopy and luminescence study of defects in semiconductor silicon

Bibliographic Details
Main Author:	Johnson, Fiona Jane
Published:	University of Bristol 1990
Subjects:	530.41 Solid-state physics
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.279773

id	ndltd-bl.uk-oai-ethos.bl.uk-279773
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-2797732015-03-19T08:57:25ZElectron microscopy and luminescence study of defects in semiconductor siliconJohnson, Fiona Jane1990530.41Solid-state physicsUniversity of Bristolhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.279773Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	530.41 Solid-state physics
spellingShingle	530.41 Solid-state physics Johnson, Fiona Jane Electron microscopy and luminescence study of defects in semiconductor silicon
author	Johnson, Fiona Jane
author_facet	Johnson, Fiona Jane
author_sort	Johnson, Fiona Jane
title	Electron microscopy and luminescence study of defects in semiconductor silicon
title_short	Electron microscopy and luminescence study of defects in semiconductor silicon
title_full	Electron microscopy and luminescence study of defects in semiconductor silicon
title_fullStr	Electron microscopy and luminescence study of defects in semiconductor silicon
title_full_unstemmed	Electron microscopy and luminescence study of defects in semiconductor silicon
title_sort	electron microscopy and luminescence study of defects in semiconductor silicon
publisher	University of Bristol
publishDate	1990
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.279773
work_keys_str_mv	AT johnsonfionajane electronmicroscopyandluminescencestudyofdefectsinsemiconductorsilicon
_version_	1716767433662922752

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