Defect generation and characterization in MOSFETs

Defect generation and characterization in MOSFETs

Bibliographic Details
Main Author: Zhang, Wei Dong
Published: Liverpool John Moores University 2002
Subjects:
621.3815
Gate dialectric
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.275794

Internet

http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.275794

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