Fault diagnosis and design for testability applied to analogue integrated circuits

Fault diagnosis and design for testability applied to analogue integrated circuits

Bibliographic Details
Main Author:	Ho, Chung Kin
Published:	University of Bath 1998
Subjects:	621.3192 Circuits
Online Access:	https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.242531

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