Fault diagnosis and design for testability applied to analogue integrated circuits

Bibliographic Details
Main Author:	Ho, Chung Kin
Published:	University of Bath 1998
Subjects:	621.3192 Circuits
Online Access:	https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.242531

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record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-2425312019-01-04T03:21:19ZFault diagnosis and design for testability applied to analogue integrated circuitsHo, Chung Kin1998621.3192CircuitsUniversity of Bathhttps://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.242531Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.3192 Circuits
spellingShingle	621.3192 Circuits Ho, Chung Kin Fault diagnosis and design for testability applied to analogue integrated circuits
author	Ho, Chung Kin
author_facet	Ho, Chung Kin
author_sort	Ho, Chung Kin
title	Fault diagnosis and design for testability applied to analogue integrated circuits
title_short	Fault diagnosis and design for testability applied to analogue integrated circuits
title_full	Fault diagnosis and design for testability applied to analogue integrated circuits
title_fullStr	Fault diagnosis and design for testability applied to analogue integrated circuits
title_full_unstemmed	Fault diagnosis and design for testability applied to analogue integrated circuits
title_sort	fault diagnosis and design for testability applied to analogue integrated circuits
publisher	University of Bath
publishDate	1998
url	https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.242531
work_keys_str_mv	AT hochungkin faultdiagnosisanddesignfortestabilityappliedtoanalogueintegratedcircuits
_version_	1718805845778628608

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