Structured test of VLSI arrays

Bibliographic Details
Main Author:	Marnane, William Peter
Published:	University of Oxford 1989
Subjects:	621.3192 Very large system integration
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238118

id	ndltd-bl.uk-oai-ethos.bl.uk-238118
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-2381182015-03-19T10:56:33ZStructured test of VLSI arraysMarnane, William Peter1989621.3192Very large system integrationUniversity of Oxfordhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238118Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.3192 Very large system integration
spellingShingle	621.3192 Very large system integration Marnane, William Peter Structured test of VLSI arrays
author	Marnane, William Peter
author_facet	Marnane, William Peter
author_sort	Marnane, William Peter
title	Structured test of VLSI arrays
title_short	Structured test of VLSI arrays
title_full	Structured test of VLSI arrays
title_fullStr	Structured test of VLSI arrays
title_full_unstemmed	Structured test of VLSI arrays
title_sort	structured test of vlsi arrays
publisher	University of Oxford
publishDate	1989
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238118
work_keys_str_mv	AT marnanewilliampeter structuredtestofvlsiarrays
_version_	1716777789432004608

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