Structural and Optical Properties of III-V Semiconductor Materials for Photovoltaics and Power Electronic Applications
abstract: This dissertation focuses on the structural and optical properties of III-V semiconductor materials. Transmission electron microscopy and atomic force microscopy are used to study at the nanometer scale, the structural properties of defects, interfaces, and surfaces. A correlation with opt...
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| Format: | Doctoral Thesis |
| Language: | English |
| Published: |
2020
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| Online Access: | http://hdl.handle.net/2286/R.I.62663 |