BagStack Classification for Data Imbalance Problems with Application to Defect Detection and Labeling in Semiconductor Units
abstract: Despite the fact that machine learning supports the development of computer vision applications by shortening the development cycle, finding a general learning algorithm that solves a wide range of applications is still bounded by the ”no free lunch theorem”. The search for the right algor...
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| Format: | Doctoral Thesis |
| Language: | English |
| Published: |
2019
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| Online Access: | http://hdl.handle.net/2286/R.I.53957 |