Post-silicon Validation of Radiation Hardened Microprocessor and SRAM arrays

Post-silicon Validation of Radiation Hardened Microprocessor and SRAM arrays

abstract: Digital systems are increasingly pervading in the everyday lives of humans. The security of these systems is a concern due to the sensitive data stored in them. The physically unclonable function (PUF) implemented on hardware provides a way to protect these systems. Static random-access me...

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Bibliographic Details
Other Authors: Medapuram, Sai Bharadwaj (Author)
Format: Dissertation
Language:English
Published: 2017
Subjects:
Electrical engineering
FPGA
Post silicon validation
PUF
Radiation Hardened Microprocessor
RTL
SRAM
Online Access:http://hdl.handle.net/2286/R.I.45532

Internet

http://hdl.handle.net/2286/R.I.45532

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