Reliability Issues and Design Solutions in Advanced CMOS Design
abstract: Over decades, scientists have been scaling devices to increasingly smaller feature sizes for ever better performance of complementary metal-oxide semiconductor (CMOS) technology to meet requirements on speed, complexity, circuit density, power consumption and ultimately cost required by ma...
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| Format: | Dissertation |
| Language: | English |
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2016
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| Online Access: | http://hdl.handle.net/2286/R.I.39448 |