The Structure and Stress Development of Adsorption, Impurity Incorporation, and Temperature Controlled Morphology for Thin Films

abstract: There is an inexorable link between structure and stress, both of which require study in order to truly understand the physics of thin films. To further our knowledge of thin films, the relationship between structure and stress development was examined in three separate systems in vacuum....

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Bibliographic Details
Other Authors: Kennedy, Jordan Kristomas (Author)
Format: Doctoral Thesis
Language:English
Published: 2011
Subjects:
Online Access:http://hdl.handle.net/2286/R.I.14377