Use of a Quartz Crystal Microbalance with Dissipation Monitoring to Study Adsorption Phenomena Relevant to Semiconductor Wet Processing

In silicon processing, contamination control is very important in each of the processing steps to ensure device reliability and enhance yield. There are many different types of contamination that are introduced at different processing steps from different sources. Industrial practice regarding conta...

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Bibliographic Details
Main Author: Wu, Bing
Other Authors: Raghavan, Srini
Language:en_US
Published: The University of Arizona. 2017
Online Access:http://hdl.handle.net/10150/626160
http://arizona.openrepository.com/arizona/handle/10150/626160

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