HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING

HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING

International Telemetering Conference Proceedings / October 24-27, 1983 / Sheraton-Harbor Island Hotel and Convention Center, San Diego, California === The need for margin analysis in high density digital data storage systems is established. A review of margin analysis techniques is presented. This...

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Main Author: Petit, Richard D.
Other Authors: Kode Inc., a Subsidiary of Odetics Inc.
Language:en_US
Published: International Foundation for Telemetering 1983
Online Access:http://hdl.handle.net/10150/612282
http://arizona.openrepository.com/arizona/handle/10150/612282
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spelling ndltd-arizona.edu-oai-arizona.openrepository.com-10150-6122822016-06-10T03:00:43Z HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING Petit, Richard D. Kode Inc., a Subsidiary of Odetics Inc. International Telemetering Conference Proceedings / October 24-27, 1983 / Sheraton-Harbor Island Hotel and Convention Center, San Diego, California The need for margin analysis in high density digital data storage systems is established. A review of margin analysis techniques is presented. This review includes a discussion of time interval analysis and a series of instruments which have evolved as a means of performing this analysis. Emphasis is given to a high resolution (1 nanosecond) statistically oriented embodiment of such an instrument. 1983-10 text Proceedings 0884-5123 0074-9079 http://hdl.handle.net/10150/612282 http://arizona.openrepository.com/arizona/handle/10150/612282 International Telemetering Conference Proceedings en_US http://www.telemetry.org/ Copyright © International Foundation for Telemetering International Foundation for Telemetering
collection NDLTD
language en_US
sources NDLTD
description International Telemetering Conference Proceedings / October 24-27, 1983 / Sheraton-Harbor Island Hotel and Convention Center, San Diego, California === The need for margin analysis in high density digital data storage systems is established. A review of margin analysis techniques is presented. This review includes a discussion of time interval analysis and a series of instruments which have evolved as a means of performing this analysis. Emphasis is given to a high resolution (1 nanosecond) statistically oriented embodiment of such an instrument.
author2 Kode Inc., a Subsidiary of Odetics Inc.
author_facet Kode Inc., a Subsidiary of Odetics Inc.
Petit, Richard D.
author Petit, Richard D.
spellingShingle Petit, Richard D.
HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING
author_sort Petit, Richard D.
title HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING
title_short HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING
title_full HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING
title_fullStr HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING
title_full_unstemmed HIGH RESOLUTION DIGITAL DATA TRANSITION ANALYSIS AND TESTING
title_sort high resolution digital data transition analysis and testing
publisher International Foundation for Telemetering
publishDate 1983
url http://hdl.handle.net/10150/612282
http://arizona.openrepository.com/arizona/handle/10150/612282
work_keys_str_mv AT petitrichardd highresolutiondigitaldatatransitionanalysisandtesting
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