A NEW TEST GENERATION ALGORITHM IMPLEMENTATION

A NEW TEST GENERATION ALGORITHM IMPLEMENTATION

This thesis describes a new test generating algorithm, depth-first algorithm. This algorithm detects the reconvergent fanout. The controllability and observability measures are included in this algorithm to guide the forward and consistency drives. The major objective of this research is to develop...

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Main Author: Chen, Yaw-Huei, 1959-
Language:en_US
Published: The University of Arizona. 1987
Subjects:
Algorithms.
Digital electronics > Testing.
Online Access:http://hdl.handle.net/10150/276527
id ndltd-arizona.edu-oai-arizona.openrepository.com-10150-276527
record_format oai_dc
spelling ndltd-arizona.edu-oai-arizona.openrepository.com-10150-2765272015-10-23T05:01:44Z A NEW TEST GENERATION ALGORITHM IMPLEMENTATION Chen, Yaw-Huei, 1959- Algorithms. Digital electronics -- Testing. This thesis describes a new test generating algorithm, depth-first algorithm. This algorithm detects the reconvergent fanout. The controllability and observability measures are included in this algorithm to guide the forward and consistency drives. The major objective of this research is to develop a test vector generatiang algorithm, which is modified from D-algorithm, and to link this algorithm with SCIRTSS programs. This depth-first algorithm is more accurate and more efficient than D-algorithm. Serveral circuits are tested under DF3 and SCR3 and the results are listed in this paper. 1987 text Thesis-Reproduction (electronic) http://hdl.handle.net/10150/276527 18152737 1332152 .b16482384 en_US Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author. The University of Arizona.
collection NDLTD
language en_US
sources NDLTD
topic Algorithms.
Digital electronics -- Testing.
spellingShingle Algorithms.
Digital electronics -- Testing.
Chen, Yaw-Huei, 1959-
A NEW TEST GENERATION ALGORITHM IMPLEMENTATION
description This thesis describes a new test generating algorithm, depth-first algorithm. This algorithm detects the reconvergent fanout. The controllability and observability measures are included in this algorithm to guide the forward and consistency drives. The major objective of this research is to develop a test vector generatiang algorithm, which is modified from D-algorithm, and to link this algorithm with SCIRTSS programs. This depth-first algorithm is more accurate and more efficient than D-algorithm. Serveral circuits are tested under DF3 and SCR3 and the results are listed in this paper.
author Chen, Yaw-Huei, 1959-
author_facet Chen, Yaw-Huei, 1959-
author_sort Chen, Yaw-Huei, 1959-
title A NEW TEST GENERATION ALGORITHM IMPLEMENTATION
title_short A NEW TEST GENERATION ALGORITHM IMPLEMENTATION
title_full A NEW TEST GENERATION ALGORITHM IMPLEMENTATION
title_fullStr A NEW TEST GENERATION ALGORITHM IMPLEMENTATION
title_full_unstemmed A NEW TEST GENERATION ALGORITHM IMPLEMENTATION
title_sort new test generation algorithm implementation
publisher The University of Arizona.
publishDate 1987
url http://hdl.handle.net/10150/276527
work_keys_str_mv AT chenyawhuei1959 anewtestgenerationalgorithmimplementation
AT chenyawhuei1959 newtestgenerationalgorithmimplementation
_version_ 1718102305507639296

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