NOISE AT SUBTHRESHOLD CURRENT IN MOS DEVICES.
Main Author: | Hojabri, Pirooz. |
---|---|
Language: | en_US |
Published: |
The University of Arizona.
1985
|
Subjects: | |
Online Access: | http://hdl.handle.net/10150/275405 |
Similar Items
-
Low frequency noise and the upconverted phase noise effects in NMOSFET circuits
by: Xie, Dingming
Published: (2012) -
Characterization of interface trap density in power MOSFETs using noise measurements
by: Huang, Chender, 1960-
Published: (1988) -
Analysis and modeling of substrate noise coupling for NMOS transistors in heavily doped substrates
by: Hsu, Shu-ching
Published: (2012) -
Noise measurements, models and analysis in GaAs MESFETs circuit design
by: Yan, Kai-tuan Kelvin
Published: (2012) -
Noise in semiconductor lasers
by: Gray, George Robert
Published: (2009)