THE KNIFE EDGE TEST AS A WAVEFRONT SENSOR (IMAGE PROCESSING).
An algorithm to reduce data from the knife edge test is given. The method is an extension of the theory of single sideband holography to second order effects. Application to phase microscopy is especially useful because a troublesome second order term vanishes when the knife edge does not attenuate...
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| Language: | en |
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The University of Arizona.
1987
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| Online Access: | http://hdl.handle.net/10150/184151 |