Parametric Yield of VLSI Systems under Variability: Analysis and Design Solutions
Variability has become one of the vital challenges that the designers of integrated circuits encounter. variability becomes increasingly important. Imperfect manufacturing process manifest itself as variations in the design parameters. These variations and those in the operating environment of VLSI...
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| Language: | en |
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2011
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| Online Access: | http://hdl.handle.net/10012/5892 |