Parametric Yield of VLSI Systems under Variability: Analysis and Design Solutions

Parametric Yield of VLSI Systems under Variability: Analysis and Design Solutions

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Variability has become one of the vital challenges that the designers of integrated circuits encounter. variability becomes increasingly important. Imperfect manufacturing process manifest itself as variations in the design parameters. These variations and those in the operating environment of VLSI...

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Bibliographic Details
Main Author: Haghdad, Kian
Language:en
Published: 2011
Subjects:
VLSI
IC Design
Yield
Variations
High temperature
Thermal profile
High performance
Low power
CAD
Design optimization
Floorplanning
Supply pad
Electrical and Computer Engineering
Online Access:http://hdl.handle.net/10012/5892

Internet

http://hdl.handle.net/10012/5892

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