Noise Analysis and Measurement for Current Mode and Voltage Mode Active Pixel Sensor Readout Methods
A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed in this study. Both flicker (1/f) and thermal noise are considered. The experimental result in this study emphasizes the computa...
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| Language: | en |
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2010
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| Online Access: | http://hdl.handle.net/10012/5107 |
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