Ion Beam Characterization and engineering of strain in semiconductor multilayers

Ion Beam Characterization and engineering of strain in semiconductor multilayers

Semiconductor multilayers

Bibliographic Details
Main Author:	Rao, Nageswara S V S
Other Authors:	Pathak, Anand P
Format:	Others
Language:	en
Published:	2007
Subjects:	Physics
Online Access:	http://hdl.handle.net/2009/1088

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