Ion Beam Characterization and engineering of strain in semiconductor multilayers

Semiconductor multilayers

Bibliographic Details
Main Author:	Rao, Nageswara S V S
Other Authors:	Pathak, Anand P
Format:	Others
Language:	en
Published:	2007
Subjects:	Physics
Online Access:	http://hdl.handle.net/2009/1088

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spelling	ndltd-Vidyanidhi-oai-210.212.200.230-2009-10882013-01-08T17:20:31ZRao, Nageswara S V SPathak, Anand P2007-11-28T11:14:00Z2007-11-28T11:14:00Z2002-12http://hdl.handle.net/2009/1088Semiconductor multilayers64927 bytes489091 bytes239848 bytes884275 bytes1675552 bytes314735 bytes860379 bytes105283 bytesapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfapplication/pdfenPhysicsIon Beam Characterization and engineering of strain in semiconductor multilayersThesis
collection	NDLTD
language	en
format	Others
sources	NDLTD
topic	Physics
spellingShingle	Physics Rao, Nageswara S V S Ion Beam Characterization and engineering of strain in semiconductor multilayers
description	Semiconductor multilayers
author2	Pathak, Anand P
author_facet	Pathak, Anand P Rao, Nageswara S V S
author	Rao, Nageswara S V S
author_sort	Rao, Nageswara S V S
title	Ion Beam Characterization and engineering of strain in semiconductor multilayers
title_short	Ion Beam Characterization and engineering of strain in semiconductor multilayers
title_full	Ion Beam Characterization and engineering of strain in semiconductor multilayers
title_fullStr	Ion Beam Characterization and engineering of strain in semiconductor multilayers
title_full_unstemmed	Ion Beam Characterization and engineering of strain in semiconductor multilayers
title_sort	ion beam characterization and engineering of strain in semiconductor multilayers
publishDate	2007
url	http://hdl.handle.net/2009/1088
work_keys_str_mv	AT raonageswarasvs ionbeamcharacterizationandengineeringofstraininsemiconductormultilayers
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Ion Beam Characterization and engineering of strain in semiconductor multilayers

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