Tools and Techniques for Evaluating Reliability Trade-offs for Nano-Architectures
It is expected that nano-scale devices and interconnections will introduce unprecedented level of defects in the substrates, and architectural designs need to accommodate the uncertainty inherent at such scales. This consideration motivates the search for new architectural paradigms based on redunda...
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Virginia Tech
2011
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| Online Access: | http://hdl.handle.net/10919/9918 http://scholar.lib.vt.edu/theses/available/etd-05122004-121332 |