Tools and Techniques for Evaluating Reliability Trade-offs for Nano-Architectures

Tools and Techniques for Evaluating Reliability Trade-offs for Nano-Architectures

It is expected that nano-scale devices and interconnections will introduce unprecedented level of defects in the substrates, and architectural designs need to accommodate the uncertainty inherent at such scales. This consideration motivates the search for new architectural paradigms based on redunda...

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Bibliographic Details
Main Author: Bhaduri, Debayan
Other Authors: Electrical and Computer Engineering
Format: Others
Published: Virginia Tech 2011
Subjects:
defect-tolerant architecture
Gaussian
reliability
PRISM
granularity
CTMR
entropy
probabilistic model checking
interconnect noise
modeling
TMR
Gibbs distribution
Nanotechnology
Online Access:http://hdl.handle.net/10919/9918
http://scholar.lib.vt.edu/theses/available/etd-05122004-121332

Internet

http://hdl.handle.net/10919/9918
http://scholar.lib.vt.edu/theses/available/etd-05122004-121332

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