Guiding RTL Test Generation Using Relevant Potential Invariants

In this thesis, we propose to use relevant potential invariants in a simulation-based swarmintelligence-based test generation technique to generate relevant test vectors for design validation at the Register Transfer Level (RTL). Providing useful guidance to the test generator for such techniques is...

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Main Author: Khanna, Tania
Other Authors: Electrical and Computer Engineering
Format: Others
Published: Virginia Tech 2018
Subjects:
Online Access:http://hdl.handle.net/10919/84483
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spelling ndltd-VTETD-oai-vtechworks.lib.vt.edu-10919-844832021-10-21T05:32:54Z Guiding RTL Test Generation Using Relevant Potential Invariants Khanna, Tania Electrical and Computer Engineering Hsiao, Michael S. Abbott, A. Lynn Zeng, Haibo Ant Colony Optimization Potential Invariants Branch Coverage Verilator In this thesis, we propose to use relevant potential invariants in a simulation-based swarmintelligence-based test generation technique to generate relevant test vectors for design validation at the Register Transfer Level (RTL). Providing useful guidance to the test generator for such techniques is critical. In our approach, we provide guidance by exploiting potential invariants in the design. These potential invariants are obtained using random stimuli such that they are true under these stimuli. Since these potential invariants are only likely to be true, we try to generate stimuli that can falsify them. Any such vectors would help reach some corners of the design. However, the space of potential invariants can be extremely large. To reduce execution time, we also implement a two-layer filter to remove the irrelevant potential invariants that may not contribute in reaching difficult states. With the filter, the vectors generated thus help to reduce the overall test length while still reach the same coverage as considering all unfiltered potential invariants. Experimental results show that with only the filtered potential invariants, we were able to reach equal or better branch coverage than that reported by BEACON in the ITC99 benchmarks, with considerable reduction in vector lengths, at reduced execution time. Master of Science 2018-08-03T08:01:25Z 2018-08-03T08:01:25Z 2018-08-02 Thesis vt_gsexam:16690 http://hdl.handle.net/10919/84483 In Copyright http://rightsstatements.org/vocab/InC/1.0/ ETD application/pdf Virginia Tech
collection NDLTD
format Others
sources NDLTD
topic Ant Colony Optimization
Potential Invariants
Branch Coverage
Verilator
spellingShingle Ant Colony Optimization
Potential Invariants
Branch Coverage
Verilator
Khanna, Tania
Guiding RTL Test Generation Using Relevant Potential Invariants
description In this thesis, we propose to use relevant potential invariants in a simulation-based swarmintelligence-based test generation technique to generate relevant test vectors for design validation at the Register Transfer Level (RTL). Providing useful guidance to the test generator for such techniques is critical. In our approach, we provide guidance by exploiting potential invariants in the design. These potential invariants are obtained using random stimuli such that they are true under these stimuli. Since these potential invariants are only likely to be true, we try to generate stimuli that can falsify them. Any such vectors would help reach some corners of the design. However, the space of potential invariants can be extremely large. To reduce execution time, we also implement a two-layer filter to remove the irrelevant potential invariants that may not contribute in reaching difficult states. With the filter, the vectors generated thus help to reduce the overall test length while still reach the same coverage as considering all unfiltered potential invariants. Experimental results show that with only the filtered potential invariants, we were able to reach equal or better branch coverage than that reported by BEACON in the ITC99 benchmarks, with considerable reduction in vector lengths, at reduced execution time. === Master of Science
author2 Electrical and Computer Engineering
author_facet Electrical and Computer Engineering
Khanna, Tania
author Khanna, Tania
author_sort Khanna, Tania
title Guiding RTL Test Generation Using Relevant Potential Invariants
title_short Guiding RTL Test Generation Using Relevant Potential Invariants
title_full Guiding RTL Test Generation Using Relevant Potential Invariants
title_fullStr Guiding RTL Test Generation Using Relevant Potential Invariants
title_full_unstemmed Guiding RTL Test Generation Using Relevant Potential Invariants
title_sort guiding rtl test generation using relevant potential invariants
publisher Virginia Tech
publishDate 2018
url http://hdl.handle.net/10919/84483
work_keys_str_mv AT khannatania guidingrtltestgenerationusingrelevantpotentialinvariants
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