A reliability comparison of recessed-gate and self-aligned gate small signal GaAs MESFETS utilizing an accelerated life test set designed for large scale automated testing
A large scale automated test set was designed and built to address the varied accelerated life test requirements of the GaAs industry. GaAs low-noise/small-signal MESFETs with 1 x 300 micron gate peripheries and 3 different gate structures were subjected to a 1000 hour high temperature storage test:...
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| Format: | Others |
| Language: | en_US |
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Virginia Polytechnic Institute and State University
2016
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| Online Access: | http://hdl.handle.net/10919/71231 |