Preparation and characterization of lead lanthanum titanate thin films by metalorganic decomposition
<p>There is a critical need for materials with very high dielectric constant to be integrated in the next generation of 64- and 256-Mb ULSI DRAMs. Materials in the Pb-based perovskite family have high relative permittivities and have consequently attracted a world wide attention. Cubic Lead La...
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| Format: | Others |
| Language: | en |
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Virginia Tech
2014
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| Online Access: | http://hdl.handle.net/10919/42122 http://scholar.lib.vt.edu/theses/available/etd-04182009-041039/ |