An x-ray diffraction method for studying small diffusion zones

An x-ray diffraction method for studying small diffusion zones

An X-ray diffraction method has been developed which was able to describe the diffusion zone produced by annealing nickel plated copper specimens at 750 degrees and 850 degrees. The experimental X-ray diffraction data were first corrected for instrumental broadening and then used to compute concent...

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Bibliographic Details
Main Author: Braski, David N.
Other Authors: Metallurgical Engineering
Format: Others
Published: Virginia Tech 2014
Subjects:
LD5655.V855 1965.B727
Copper
Diffusion
Nickel
X-rays > Diffraction
Online Access:http://hdl.handle.net/10919/41203
http://scholar.lib.vt.edu/theses/available/etd-02162010-020508/
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spelling ndltd-VTETD-oai-vtechworks.lib.vt.edu-10919-412032021-05-05T05:40:48Z An x-ray diffraction method for studying small diffusion zones Braski, David N. Metallurgical Engineering Houska, Charles R. LD5655.V855 1965.B727 Copper Diffusion Nickel X-rays -- Diffraction An X-ray diffraction method has been developed which was able to describe the diffusion zone produced by annealing nickel plated copper specimens at 750 degrees and 850 degrees. The experimental X-ray diffraction data were first corrected for instrumental broadening and then used to compute concentration-penetration curves across the diffusion zone. the experimental curves are in general agreement with a new mathematical analysis and also the diffusion coefficients reported in the literature. Master of Science 2014-03-14T21:29:57Z 2014-03-14T21:29:57Z 1965-05-03 2010-02-16 2010-02-16 2010-02-16 Thesis Text etd-02162010-020508 http://hdl.handle.net/10919/41203 http://scholar.lib.vt.edu/theses/available/etd-02162010-020508/ OCLC# 07104618 LD5655.V855_1965.B727.pdf In Copyright http://rightsstatements.org/vocab/InC/1.0/ 54 pages, 1 unnumbered leaves BTD application/pdf application/pdf Virginia Tech
collection NDLTD
format Others
sources NDLTD
topic LD5655.V855 1965.B727
Copper
Diffusion
Nickel
X-rays -- Diffraction
spellingShingle LD5655.V855 1965.B727
Copper
Diffusion
Nickel
X-rays -- Diffraction
Braski, David N.
An x-ray diffraction method for studying small diffusion zones
description An X-ray diffraction method has been developed which was able to describe the diffusion zone produced by annealing nickel plated copper specimens at 750 degrees and 850 degrees. The experimental X-ray diffraction data were first corrected for instrumental broadening and then used to compute concentration-penetration curves across the diffusion zone. the experimental curves are in general agreement with a new mathematical analysis and also the diffusion coefficients reported in the literature. === Master of Science
author2 Metallurgical Engineering
author_facet Metallurgical Engineering
Braski, David N.
author Braski, David N.
author_sort Braski, David N.
title An x-ray diffraction method for studying small diffusion zones
title_short An x-ray diffraction method for studying small diffusion zones
title_full An x-ray diffraction method for studying small diffusion zones
title_fullStr An x-ray diffraction method for studying small diffusion zones
title_full_unstemmed An x-ray diffraction method for studying small diffusion zones
title_sort x-ray diffraction method for studying small diffusion zones
publisher Virginia Tech
publishDate 2014
url http://hdl.handle.net/10919/41203
http://scholar.lib.vt.edu/theses/available/etd-02162010-020508/
work_keys_str_mv AT braskidavidn anxraydiffractionmethodforstudyingsmalldiffusionzones
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