An x-ray diffraction method for studying small diffusion zones
An X-ray diffraction method has been developed which was able to describe the diffusion zone produced by annealing nickel plated copper specimens at 750 degrees and 850 degrees. The experimental X-ray diffraction data were first corrected for instrumental broadening and then used to compute concent...
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| Format: | Others |
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Virginia Tech
2014
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| Online Access: | http://hdl.handle.net/10919/41203 http://scholar.lib.vt.edu/theses/available/etd-02162010-020508/ |
| Summary: | An X-ray diffraction method has been developed which was able to describe the diffusion zone produced by annealing nickel plated copper specimens at 750 degrees and 850 degrees. The experimental X-ray diffraction data were first corrected for instrumental broadening and then used to compute concentration-penetration curves across the diffusion zone. the experimental curves are in general agreement with a new mathematical analysis and also the diffusion coefficients reported in the literature. === Master of Science |
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