Wideband characterization of aluminum nitride substrates and high power-high frequency thick film applications
Ceramic substrates play an important role in thick film hybrid microelectronic circuits. Existing substrates such as alumina and beryllia do not meet satisfactorily the desired requirements. The newly developed aluminum nitride (<i>AIN</i>) substrate shows a great deal of promise and pot...
Main Author: | Farzanehfard, Hosein |
---|---|
Other Authors: | Electrical Engineering |
Format: | Others |
Language: | en |
Published: |
Virginia Tech
2014
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Subjects: | |
Online Access: | http://hdl.handle.net/10919/39788 http://scholar.lib.vt.edu/theses/available/etd-10122005-134447/ |
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