Design and Verification of a High Voltage, Capacitance Voltage Measurement System for Power MOSFETs
There is a need for a high voltage, capacitance voltage (HV, CV) measurement system for the measurement and characterization of silicon carbide (SiC) power MOSFETs. The following study discusses the circuit layout and automation software for a measurement system that can perform CV measurements for...
Main Author: | Ralston, Parrish Elaine |
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Other Authors: | Electrical and Computer Engineering |
Format: | Others |
Published: |
Virginia Tech
2014
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Subjects: | |
Online Access: | http://hdl.handle.net/10919/36169 http://scholar.lib.vt.edu/theses/available/etd-12152008-172537/ |
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