Large-signal characterization and modeling of nonlinear devices using scattering parameters
Characterization and modeling of devices at high drive levels often requires specialized equipment and measurement techniques. Many large-signal devices will never have traditional nonlinear models because model development is expensive and time-consuming. Due to the complexity of the device or th...
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Virginia Tech
2014
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| Online Access: | http://hdl.handle.net/10919/35548 http://scholar.lib.vt.edu/theses/available/etd-10312002-202143/ |