| Summary: | Ensuring low power operation is a major challenge for designers in the era of portable devices, cloud computing and networked sensor systems. Concomitantly, combinational logic soft errors caused by radiation particle strikes have emerged as a major reliability-limiting problem for integrated circuits. However, most approaches that mitigate combinational logic soft errors lead to significant power overheads. This work explores techniques to jointly reduce the power consumption as well as mitigate combinational logic soft errors. At the circuit level, this is achieved by redesigning circuits in a way that reduces the number of switching nodes and reduces the effective area of the circuit that is sensitive to radiation particle strikes. At the architectural level, pipelining is used as a tool to lower power consumption and improve the combinational logic soft error reliability. Thus, optimization for power and soft error reliability is performed at various levels of design abstraction and the benefit of cross-layer optimization is identified. Additionally, the impact of technology scaling on the combinational logic soft error rate is identified experimentally and predictions for future technology generations are made.
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