Soft error aware physical synthesis

To allow accurate analysis of Soft Errors by Electronic Design Automation (EDA) tools, analytical models were developed to estimate electrical characteristics of the single event. The Ambipolar-Diffusion-With-Cutoff (ADC) model was extended in this work to model charge sharing, thus allowing accurat...

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Main Author: Assis, Thiago Rocha de
Other Authors: Dr. Bharat L. Bhuva
Format: Others
Language:en
Published: VANDERBILT 2015
Subjects:
Online Access:http://etd.library.vanderbilt.edu/available/etd-11242015-013303/
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spelling ndltd-VANDERBILT-oai-VANDERBILTETD-etd-11242015-0133032015-12-05T04:55:36Z Soft error aware physical synthesis Assis, Thiago Rocha de Electrical Engineering To allow accurate analysis of Soft Errors by Electronic Design Automation (EDA) tools, analytical models were developed to estimate electrical characteristics of the single event. The Ambipolar-Diffusion-With-Cutoff (ADC) model was extended in this work to model charge sharing, thus allowing accurate charge estimation by EDA tools An Single Event Transient (SET) pulse width estimation methodology was developed to model the Standard Cells response to the soft error. Combining these models along with circuit masking probabilities, the circuit soft-error cross-section is estimated. These soft error models are then integrated into an automatic standard cell placement tool based on Quadratic Optimization. Results show the impact of Physical Synthesis electrical correction techniques, such as Buffering, Gate Cloning and Gate Sizing, to the circuit soft error cross-section. Furthermore, an algorithm to reduce the circuit soft error cross-section by optimizing the Tap Cell placement was also developed and demonstrated. Results from this thesis provide key insights to control the circuit soft error cross-section during the Physical Synthesis design flow for integrated circuits at the most advanced technology nodes. Dr. Bharat L. Bhuva Dr. Aniruddha S. Gokhale Dr. Shi-Jie Wen Dr. William H. Robinson Dr. Ronald D. Schrimpf VANDERBILT 2015-12-04 text application/pdf http://etd.library.vanderbilt.edu/available/etd-11242015-013303/ http://etd.library.vanderbilt.edu/available/etd-11242015-013303/ en unrestricted I hereby certify that, if appropriate, I have obtained and attached hereto a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dissertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. I hereby grant to Vanderbilt University or its agents the non-exclusive license to archive and make accessible, under the conditions specified below, my thesis, dissertation, or project report in whole or in part in all forms of media, now or hereafter known. I retain all other ownership rights to the copyright of the thesis, dissertation or project report. I also retain the right to use in future works (such as articles or books) all or part of this thesis, dissertation, or project report.
collection NDLTD
language en
format Others
sources NDLTD
topic Electrical Engineering
spellingShingle Electrical Engineering
Assis, Thiago Rocha de
Soft error aware physical synthesis
description To allow accurate analysis of Soft Errors by Electronic Design Automation (EDA) tools, analytical models were developed to estimate electrical characteristics of the single event. The Ambipolar-Diffusion-With-Cutoff (ADC) model was extended in this work to model charge sharing, thus allowing accurate charge estimation by EDA tools An Single Event Transient (SET) pulse width estimation methodology was developed to model the Standard Cells response to the soft error. Combining these models along with circuit masking probabilities, the circuit soft-error cross-section is estimated. These soft error models are then integrated into an automatic standard cell placement tool based on Quadratic Optimization. Results show the impact of Physical Synthesis electrical correction techniques, such as Buffering, Gate Cloning and Gate Sizing, to the circuit soft error cross-section. Furthermore, an algorithm to reduce the circuit soft error cross-section by optimizing the Tap Cell placement was also developed and demonstrated. Results from this thesis provide key insights to control the circuit soft error cross-section during the Physical Synthesis design flow for integrated circuits at the most advanced technology nodes.
author2 Dr. Bharat L. Bhuva
author_facet Dr. Bharat L. Bhuva
Assis, Thiago Rocha de
author Assis, Thiago Rocha de
author_sort Assis, Thiago Rocha de
title Soft error aware physical synthesis
title_short Soft error aware physical synthesis
title_full Soft error aware physical synthesis
title_fullStr Soft error aware physical synthesis
title_full_unstemmed Soft error aware physical synthesis
title_sort soft error aware physical synthesis
publisher VANDERBILT
publishDate 2015
url http://etd.library.vanderbilt.edu/available/etd-11242015-013303/
work_keys_str_mv AT assisthiagorochade softerrorawarephysicalsynthesis
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