IMPACT OF PROCESS VARIATIONS ON SOFT ERROR SENSITIVITY OF 32-NM VLSI CIRCUITS IN NEAR-THRESHOLD REGION
Power consumption has become a major concern of integrated circuit (IC) design. Reducing the supply voltage to the near-threshold region is one method to reduce the power consumption. However, operating in this region makes the circuit more sensitive to process variations. In the thesis, the impact...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2014
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-04082014-141041/ |