SINGLE EVENT EFFECTS IN COMMERCIAL MICROPROCESSORS USING DYNAMIC CIRCUITRY
In this work the impact of technology trends on alpha particle induced soft error rates in state-of-the-art commercial microprocessors has been investigated. At the device level, both critical charge and charge collection efficiency decreases as technologies move to the next generation. For the two...
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| Format: | Others |
| Language: | en |
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| Online Access: | http://etd.library.vanderbilt.edu/theses/available/etd-0319102-140903/ |