ENERGY DEPOSITION MECHANISMS FOR PROTON- AND NEUTRON-INDUCED SINGLE EVENT UPSETS IN MODERN ELECTRONIC DEVICES
As the dimensions in modern integrated circuits (ICs) become smaller, electronic devices become more susceptible to failure due to radiation effects. One type of effect, caused by energy deposition from a single particle strike, is called a single event upset (SEU). SEUs are a concern for devices bo...
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| Language: | en |
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VANDERBILT
2012
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-03162012-145223/ |