Evaluation and extension of threaded control for high-mix semiconductor manufacturing

In the recent years threaded run-to-run (RtR) control algorithms have experienced drawbacks under certain circumstances, one such trait is when applied to high-mix of products such as in Application Specific Integrated Circuits (ASIC) foundries. The variations in the process are a function of the pr...

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Main Author: Patwardhan, Ninad Narendra
Format: Others
Language:English
Published: 2011
Subjects:
MSE
RtR
Online Access:http://hdl.handle.net/2152/ETD-UT-2010-12-2097
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spelling ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-ETD-UT-2010-12-20972015-09-20T16:57:31ZEvaluation and extension of threaded control for high-mix semiconductor manufacturingPatwardhan, Ninad NarendraThreaded controlEWMADisturbanceNoiseEstimationMSELithographyOverlayRtRHigh-mixSemiconductor manufacturingProcess controlIn the recent years threaded run-to-run (RtR) control algorithms have experienced drawbacks under certain circumstances, one such trait is when applied to high-mix of products such as in Application Specific Integrated Circuits (ASIC) foundries. The variations in the process are a function of the product being manufactured as well as the tool being used. The presence of semiconductor layers increases the number of times the lithography process must be repeated. Successive layers having different patterns must be exposed using different reticles/masks in order to maximize tool utilizations. The objectives of this research are to develop a set of methodologies for evaluation and extension of threaded control applied to overlay. This project defines methods to quantify the efficacy of threaded controls, finds the drawbacks of threaded control under production of high mix of semiconductors and suggests extensions and alternatives to improve threaded control. To evaluate the performance of threaded control, extensive simulations were performed in MATLAB. The effects of noise, disturbances, sampling and delays on the control and estimation performance of threaded controller were studied through these simulations. Based on the results obtained, several ideas to extend threaded control by reducing overall number of threads, by improving thread definitions and combination have been introduced. A unique idea of sampling the measurements dynamically based on the estimation accuracy is also presented. Future work includes implementing the extensions to threaded control suggested in this work in real production data and comparing the results without the use of those methods. Future work also includes building new alternatives to threaded control.text2011-02-14T20:44:26Z2011-02-14T20:44:40Z2011-02-14T20:44:26Z2011-02-14T20:44:40Z2010-122011-02-14December 20102011-02-14T20:44:40Zthesisapplication/pdfhttp://hdl.handle.net/2152/ETD-UT-2010-12-2097eng
collection NDLTD
language English
format Others
sources NDLTD
topic Threaded control
EWMA
Disturbance
Noise
Estimation
MSE
Lithography
Overlay
RtR
High-mix
Semiconductor manufacturing
Process control
spellingShingle Threaded control
EWMA
Disturbance
Noise
Estimation
MSE
Lithography
Overlay
RtR
High-mix
Semiconductor manufacturing
Process control
Patwardhan, Ninad Narendra
Evaluation and extension of threaded control for high-mix semiconductor manufacturing
description In the recent years threaded run-to-run (RtR) control algorithms have experienced drawbacks under certain circumstances, one such trait is when applied to high-mix of products such as in Application Specific Integrated Circuits (ASIC) foundries. The variations in the process are a function of the product being manufactured as well as the tool being used. The presence of semiconductor layers increases the number of times the lithography process must be repeated. Successive layers having different patterns must be exposed using different reticles/masks in order to maximize tool utilizations. The objectives of this research are to develop a set of methodologies for evaluation and extension of threaded control applied to overlay. This project defines methods to quantify the efficacy of threaded controls, finds the drawbacks of threaded control under production of high mix of semiconductors and suggests extensions and alternatives to improve threaded control. To evaluate the performance of threaded control, extensive simulations were performed in MATLAB. The effects of noise, disturbances, sampling and delays on the control and estimation performance of threaded controller were studied through these simulations. Based on the results obtained, several ideas to extend threaded control by reducing overall number of threads, by improving thread definitions and combination have been introduced. A unique idea of sampling the measurements dynamically based on the estimation accuracy is also presented. Future work includes implementing the extensions to threaded control suggested in this work in real production data and comparing the results without the use of those methods. Future work also includes building new alternatives to threaded control. === text
author Patwardhan, Ninad Narendra
author_facet Patwardhan, Ninad Narendra
author_sort Patwardhan, Ninad Narendra
title Evaluation and extension of threaded control for high-mix semiconductor manufacturing
title_short Evaluation and extension of threaded control for high-mix semiconductor manufacturing
title_full Evaluation and extension of threaded control for high-mix semiconductor manufacturing
title_fullStr Evaluation and extension of threaded control for high-mix semiconductor manufacturing
title_full_unstemmed Evaluation and extension of threaded control for high-mix semiconductor manufacturing
title_sort evaluation and extension of threaded control for high-mix semiconductor manufacturing
publishDate 2011
url http://hdl.handle.net/2152/ETD-UT-2010-12-2097
work_keys_str_mv AT patwardhanninadnarendra evaluationandextensionofthreadedcontrolforhighmixsemiconductormanufacturing
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