A random jitter RMS measurement method using AND and OR operations
Jitter is defined as timing uncertainties of digital signals at their intended ideal positions in time. While it undermines valuable clock budget and limits the maximum clock frequency in I/O circuitry, it is one of the most difficult parameters to measure accurately due to the small value and rando...
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Other Authors: | |
Format: | Others |
Language: | English |
Published: |
2010
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Online Access: | http://hdl.handle.net/2152/ETD-UT-2009-12-646 |
Summary: | Jitter is defined as timing uncertainties of digital signals at their intended
ideal positions in time. While it undermines valuable clock budget and
limits the maximum clock frequency in I/O circuitry, it is one of the most difficult
parameters to measure accurately due to the small value and randomness.
This thesis proposes a random jitter RMS measurement method using AND
and OR operations, which targets BIST applications.
This thesis is organized as follows. Chapter 1 introduces the motivation
of the proposed work. It includes a comparison between two major approaches
to jitter measurement. Chapter 2 explains the proposed random jitter estimation
method in detail. Chapter 3 describes circuit implementations with
design considerations. Chapter 4 demonstrates estimation results from circuit
level simulation runs. Chapter 5 discusses the source of error in the jitter
estimation and concludes. === text |
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