Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices

Not available === text

Bibliographic Details
Main Author:	Ko, Kil-soo
Format:	Others
Language:	English
Published:	2008
Subjects:	Electron holography
Online Access:	http://hdl.handle.net/2152/709

id	ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-709
record_format	oai_dc
spelling	ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-7092015-09-20T16:49:09ZCharacterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devicesKo, Kil-sooElectron holographyNot availabletext2008-08-28T21:32:21Z2008-08-28T21:32:21Z20032008-08-28T21:32:21ZThesiselectronicb56858917http://hdl.handle.net/2152/709562081463116359engCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.
collection	NDLTD
language	English
format	Others
sources	NDLTD
topic	Electron holography
spellingShingle	Electron holography Ko, Kil-soo Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices
description	Not available === text
author	Ko, Kil-soo
author_facet	Ko, Kil-soo
author_sort	Ko, Kil-soo
title	Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices
title_short	Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices
title_full	Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices
title_fullStr	Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices
title_full_unstemmed	Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices
title_sort	characterization of two-dimensional electrostatic potential profiles in deep submicron mosfet devices
publishDate	2008
url	http://hdl.handle.net/2152/709
work_keys_str_mv	AT kokilsoo characterizationoftwodimensionalelectrostaticpotentialprofilesindeepsubmicronmosfetdevices
_version_	1716819710878679040

Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices

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