Time-based oversampled analog-to-digital converters in nano-scale integrated circuits

In this research, a time-based oversampling delta-sigma (ΔΣ) ADC architecture is introduced. This system uses time, rather than voltage or current, as the analog variable for its quantizer, and the noise shaping process is realized by modulating the width of a variable-width digital “pulse.” The ΔΣ...

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Main Author: Jung, Woo Young
Format: Others
Language:en
Published: 2015
Subjects:
Online Access:http://hdl.handle.net/2152/29195
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spelling ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-291952015-09-20T17:30:44ZTime-based oversampled analog-to-digital converters in nano-scale integrated circuitsJung, Woo YoungAnalog-to-digital converterDelta-sigma modulationTime-to-digital converterPulse-width modulationDigital-to-time converterIn this research, a time-based oversampling delta-sigma (ΔΣ) ADC architecture is introduced. This system uses time, rather than voltage or current, as the analog variable for its quantizer, and the noise shaping process is realized by modulating the width of a variable-width digital “pulse.” The ΔΣ loop integrator, the quantizer and digital-to-analog converter (DAC) are all time-based circuits and are implemented using digital gates only. Hence, no amplifier or voltage-based circuit is required. The proposed architecture not only offers a viable for nano-scale ‘digital’ IC technologies, but also enables improved circuit performance compared to the state-of-the-art. This is in contrast to conventional voltage-based analog circuit design, whose performance decreases with scaling due to increasingly higher voltage uncertainty due to supply voltage. The proposed architecture allows all digital implementation after the Voltage to Time Converter (VTC) and merged multi-bit quantizer/DAC blocks by taking advantage of delay lines reusable in both quantization and DAC operation. The novelty of this architecture is digital pulse width processing to implement the ΔΣ modulation. It is realized with small area and potentially can take advantage from the process scaling. A 3-bit prototype of this ADC in 0.18 μm CMOS process is implemented, tested, and presented. With an OSR of 36 and a bandwidth of 2 MHz, it achieves a SNDR of 34.6 dB while consuming 1.5 mA from a 1.8 V supply. The core occupies an area of 0.0275 mm² (110μm × 250μm = 0.0275 mm²). The second generation of the architecture was fabricated in IBM 45 nm SOI process. The oversampling frequency of this system is 705 MHz and oversampling ratio of 64. The expected performance is 7-bit effective resolution for a 5.5 MHz bandwidth while consuming 8mW of power and occupying a core area of less than 0.02 mm² (160μm × 120μm = 0.0192 mm²).text2015-03-30T15:48:44Z2014-122015-03-30December 20142015-03-30T15:48:45ZThesisapplication/pdfhttp://hdl.handle.net/2152/29195en
collection NDLTD
language en
format Others
sources NDLTD
topic Analog-to-digital converter
Delta-sigma modulation
Time-to-digital converter
Pulse-width modulation
Digital-to-time converter
spellingShingle Analog-to-digital converter
Delta-sigma modulation
Time-to-digital converter
Pulse-width modulation
Digital-to-time converter
Jung, Woo Young
Time-based oversampled analog-to-digital converters in nano-scale integrated circuits
description In this research, a time-based oversampling delta-sigma (ΔΣ) ADC architecture is introduced. This system uses time, rather than voltage or current, as the analog variable for its quantizer, and the noise shaping process is realized by modulating the width of a variable-width digital “pulse.” The ΔΣ loop integrator, the quantizer and digital-to-analog converter (DAC) are all time-based circuits and are implemented using digital gates only. Hence, no amplifier or voltage-based circuit is required. The proposed architecture not only offers a viable for nano-scale ‘digital’ IC technologies, but also enables improved circuit performance compared to the state-of-the-art. This is in contrast to conventional voltage-based analog circuit design, whose performance decreases with scaling due to increasingly higher voltage uncertainty due to supply voltage. The proposed architecture allows all digital implementation after the Voltage to Time Converter (VTC) and merged multi-bit quantizer/DAC blocks by taking advantage of delay lines reusable in both quantization and DAC operation. The novelty of this architecture is digital pulse width processing to implement the ΔΣ modulation. It is realized with small area and potentially can take advantage from the process scaling. A 3-bit prototype of this ADC in 0.18 μm CMOS process is implemented, tested, and presented. With an OSR of 36 and a bandwidth of 2 MHz, it achieves a SNDR of 34.6 dB while consuming 1.5 mA from a 1.8 V supply. The core occupies an area of 0.0275 mm² (110μm × 250μm = 0.0275 mm²). The second generation of the architecture was fabricated in IBM 45 nm SOI process. The oversampling frequency of this system is 705 MHz and oversampling ratio of 64. The expected performance is 7-bit effective resolution for a 5.5 MHz bandwidth while consuming 8mW of power and occupying a core area of less than 0.02 mm² (160μm × 120μm = 0.0192 mm²). === text
author Jung, Woo Young
author_facet Jung, Woo Young
author_sort Jung, Woo Young
title Time-based oversampled analog-to-digital converters in nano-scale integrated circuits
title_short Time-based oversampled analog-to-digital converters in nano-scale integrated circuits
title_full Time-based oversampled analog-to-digital converters in nano-scale integrated circuits
title_fullStr Time-based oversampled analog-to-digital converters in nano-scale integrated circuits
title_full_unstemmed Time-based oversampled analog-to-digital converters in nano-scale integrated circuits
title_sort time-based oversampled analog-to-digital converters in nano-scale integrated circuits
publishDate 2015
url http://hdl.handle.net/2152/29195
work_keys_str_mv AT jungwooyoung timebasedoversampledanalogtodigitalconvertersinnanoscaleintegratedcircuits
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