Combination of trace and scan signals for debuggability enhancement in post-silicon validation
Pre-silicon verification is an essential part of integrated circuit design to capture functional design errors. Complex simulation, emulation and formal verification tools are used in a virtual environment before the device is manufactured in silicon. However, as the design complexity increases and...
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| Format: | Others |
| Language: | en_US |
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2013
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| Online Access: | http://hdl.handle.net/2152/20864 |