Dynamics of defects and dopants in complex systems: si and oxide surfaces and interfaces

Dynamics of defects and dopants in complex systems: si and oxide surfaces and interfaces

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Bibliographic Details
Main Author: Kirichenko, Taras Alexandrovich
Format: Others
Language:English
Published: 2008
Subjects:
Silicon oxide films
Semiconductors > Defects
Silicon crystals > Analysis
Online Access:http://hdl.handle.net/2152/1785

Internet

http://hdl.handle.net/2152/1785

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