Testability and fault modeling of partially depleted silicon-on-insulator integrated circuits

Testability and fault modeling of partially depleted silicon-on-insulator integrated circuits

Not available === text

Bibliographic Details
Main Author: MacDonald, Eric William
Format: Others
Language:English
Published: 2011
Subjects:
Silicon-on-insulator technology
Integrated circuits
Online Access:http://hdl.handle.net/2152/11131
id ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-11131
record_format oai_dc
spelling ndltd-UTEXAS-oai-repositories.lib.utexas.edu-2152-111312015-09-20T16:59:12ZTestability and fault modeling of partially depleted silicon-on-insulator integrated circuitsMacDonald, Eric WilliamSilicon-on-insulator technologyIntegrated circuitsNot availabletext2011-05-05T22:00:35Z2011-05-05T22:00:35Z2002-052011-05-05electronichttp://hdl.handle.net/2152/11131engCopyright is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.Restricted
collection NDLTD
language English
format Others
sources NDLTD
topic Silicon-on-insulator technology
Integrated circuits
spellingShingle Silicon-on-insulator technology
Integrated circuits
MacDonald, Eric William
Testability and fault modeling of partially depleted silicon-on-insulator integrated circuits
description Not available === text
author MacDonald, Eric William
author_facet MacDonald, Eric William
author_sort MacDonald, Eric William
title Testability and fault modeling of partially depleted silicon-on-insulator integrated circuits
title_short Testability and fault modeling of partially depleted silicon-on-insulator integrated circuits
title_full Testability and fault modeling of partially depleted silicon-on-insulator integrated circuits
title_fullStr Testability and fault modeling of partially depleted silicon-on-insulator integrated circuits
title_full_unstemmed Testability and fault modeling of partially depleted silicon-on-insulator integrated circuits
title_sort testability and fault modeling of partially depleted silicon-on-insulator integrated circuits
publishDate 2011
url http://hdl.handle.net/2152/11131
work_keys_str_mv AT macdonaldericwilliam testabilityandfaultmodelingofpartiallydepletedsilicononinsulatorintegratedcircuits
_version_ 1716821400360058880

Similar Items