Observation of Analyte-Induced Deflections for Uncoated Microcantilevers using the Focused Ion Beam Procedure
It has been found that structural modifications, involving the creation of submicron scale grooves on uncoated silicon nitride microcantilevers, allow microcantilevers to display analyte-induced deflections which have not been previously observed. The submicron grooves were created through the use o...
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Trace: Tennessee Research and Creative Exchange
2008
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| Online Access: | http://trace.tennessee.edu/utk_gradthes/454 |