Investigating the Effect of Capping Layers on Final Thin Film Morphology After a Dewetting Process

Nanoparticles on a substrate have numerous applications in nanotechnology, from enhancements to solar cell efficiency to improvements in carbon nanotube growth. Producing nanoparticles in a cheap fashion with some control over size and spacing is difficult to do, but desired. This work presents a no...

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Main Author: White, Benjamin C.
Format: Others
Published: DigitalCommons@USU 2016
Subjects:
Online Access:https://digitalcommons.usu.edu/etd/4955
https://digitalcommons.usu.edu/cgi/viewcontent.cgi?article=5989&context=etd
id ndltd-UTAHS-oai-digitalcommons.usu.edu-etd-5989
record_format oai_dc
spelling ndltd-UTAHS-oai-digitalcommons.usu.edu-etd-59892019-10-13T05:44:30Z Investigating the Effect of Capping Layers on Final Thin Film Morphology After a Dewetting Process White, Benjamin C. Nanoparticles on a substrate have numerous applications in nanotechnology, from enhancements to solar cell efficiency to improvements in carbon nanotube growth. Producing nanoparticles in a cheap fashion with some control over size and spacing is difficult to do, but desired. This work presents a novel method for altering the radius and pitch distributions of nickel and gold nanoparticles in a scalable fashion. The introduction of alumina capping layers to thin nickel lms during a pulsed laser-induced dewetting process has yielded reductions in the mean and standard deviation of radii and pitch for dewet nanoparticles. Carbon nanotube mats grown on these samples show a much thicker mat for the capped case. The same capping layers have produced an opposite effect of increased nanoparticle size and spacing during a solid state dewetting process of a gold lm. These results also show a decrease in the magnitude of the effect as the capping layer thickness increases. Since the subject of research interest for using these nanoparticles has shifted towards producing ordered arrays with size and spacing control, the uncertainty in the values of these distributions needs to be quantified for any form of meaningful comparison to be made between fabrication methods. Presented here is a first step in the uncertainty analysis of such samples via synthetic images producing error distributions. 2016-05-01T07:00:00Z text application/pdf https://digitalcommons.usu.edu/etd/4955 https://digitalcommons.usu.edu/cgi/viewcontent.cgi?article=5989&context=etd Copyright for this work is held by the author. Transmission or reproduction of materials protected by copyright beyond that allowed by fair use requires the written permission of the copyright owners. Works not in the public domain cannot be commercially exploited without permission of the copyright owner. Responsibility for any use rests exclusively with the user. For more information contact Andrew Wesolek (andrew.wesolek@usu.edu). All Graduate Theses and Dissertations DigitalCommons@USU Mechanical Engineering
collection NDLTD
format Others
sources NDLTD
topic Mechanical Engineering
spellingShingle Mechanical Engineering
White, Benjamin C.
Investigating the Effect of Capping Layers on Final Thin Film Morphology After a Dewetting Process
description Nanoparticles on a substrate have numerous applications in nanotechnology, from enhancements to solar cell efficiency to improvements in carbon nanotube growth. Producing nanoparticles in a cheap fashion with some control over size and spacing is difficult to do, but desired. This work presents a novel method for altering the radius and pitch distributions of nickel and gold nanoparticles in a scalable fashion. The introduction of alumina capping layers to thin nickel lms during a pulsed laser-induced dewetting process has yielded reductions in the mean and standard deviation of radii and pitch for dewet nanoparticles. Carbon nanotube mats grown on these samples show a much thicker mat for the capped case. The same capping layers have produced an opposite effect of increased nanoparticle size and spacing during a solid state dewetting process of a gold lm. These results also show a decrease in the magnitude of the effect as the capping layer thickness increases. Since the subject of research interest for using these nanoparticles has shifted towards producing ordered arrays with size and spacing control, the uncertainty in the values of these distributions needs to be quantified for any form of meaningful comparison to be made between fabrication methods. Presented here is a first step in the uncertainty analysis of such samples via synthetic images producing error distributions.
author White, Benjamin C.
author_facet White, Benjamin C.
author_sort White, Benjamin C.
title Investigating the Effect of Capping Layers on Final Thin Film Morphology After a Dewetting Process
title_short Investigating the Effect of Capping Layers on Final Thin Film Morphology After a Dewetting Process
title_full Investigating the Effect of Capping Layers on Final Thin Film Morphology After a Dewetting Process
title_fullStr Investigating the Effect of Capping Layers on Final Thin Film Morphology After a Dewetting Process
title_full_unstemmed Investigating the Effect of Capping Layers on Final Thin Film Morphology After a Dewetting Process
title_sort investigating the effect of capping layers on final thin film morphology after a dewetting process
publisher DigitalCommons@USU
publishDate 2016
url https://digitalcommons.usu.edu/etd/4955
https://digitalcommons.usu.edu/cgi/viewcontent.cgi?article=5989&context=etd
work_keys_str_mv AT whitebenjaminc investigatingtheeffectofcappinglayersonfinalthinfilmmorphologyafteradewettingprocess
_version_ 1719266502739230720