Mechanical support design of analyzer for a diffraction enhanced x-ray imaging (DEI) system
Diffraction Enhanced X-ray Imaging (DEI) uses synchrotron X-ray beams prepared and analyzed by perfect single crystals to achieve imaging contrast from a number of phenomena taking place in an object under investigation. The crystals used in DEI for imaging requires high precision positioning due to...
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| Format: | Others |
| Language: | en |
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University of Saskatchewan
2007
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| Online Access: | http://library.usask.ca/theses/available/etd-05172007-160800/ |