Electronic Properties of Metal Oxide Films Studied by Core Level Spectroscopy
In this dissertation core level electron spectroscopy has been employed to study various aspects of metal oxide films grown under ultra-high vacuum conditions. Studies on in situ ion insertion of lithium into thin TiO2 systems were performed. The electronic and geometric properties are investigated...
Main Author: | Richter, Jan Hinnerk |
---|---|
Format: | Doctoral Thesis |
Language: | English |
Published: |
Uppsala universitet, Fysiska institutionen
2006
|
Subjects: | |
Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-7180 http://nbn-resolving.de/urn:isbn:91-554-6673-7 |
Similar Items
-
Surface Science Studies of Metal Oxides Formed by Chemical Vapour Deposition on Silicon
by: Karlsson, Patrik
Published: (2006) -
Graphene/SrTiO3 hetero interface studied by X-ray photoelectron spectroscopy
by: S. Karamat, et al.
Published: (2016-08-01) -
FTIR study of the thermolysis of some MOCVD precursors
by: Ashworth, Andrew Paul
Published: (1991) -
Laser growth of microelectronic materials
by: Binnie, T. D.
Published: (1987) -
One-step growth of thin film SnS with large grains using MOCVD
by: Andrew J. Clayton, et al.
Published: (2018-12-01)