Investigation of Focused Ion Beam/Scanning Electron Microscope parameters for Slice and View and Energy Dispersive X-ray Spectroscopy of Embedded Brain Tissue
This Thesis investigates the optimization of a Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) Slice and View protocol of brain tissue. Using a Slice and View protocol in a Dualbeam instrument, the ion and electron beams are used in sequence to alternately mill and image the newly exposed su...
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| Format: | Others |
| Language: | English |
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Norges teknisk-naturvitenskapelige universitet, Institutt for materialteknologi
2014
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-25765 |